Transmission electron microscopy is a powerful
tool to investigate crystallographic defects down to the nanoscale, and is a
critical technique to study irradiated materials. The JEOL 100CXII, a 100kV TEM
with a lattice resolution of 0.2 nm, is dedicated for microstructure
observations on high-dose neutron-irradiated specimens. The work focuses on
defect structure and microstructure evaluations. The examinations help
understand various degradation mechanisms related to neutron irradiation
